This test method establishes the apparatus to be used, specimen preparation methods, and standard procedures for determining the presence of surface flaws in tungsten-seal rods and wires of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
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1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
glass bead; glass-to-metal seals; tungsten-glass seals; Electrical conductor wire; Glass electronic seals; Metal electronic components/devices; Seals--electronic applications; Surface analysis--electronic components/devices; Tungsten electrical/electronic applications; Wire--electronic devices;
ICS Number Code 21.140 (Seals, glands)
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