Active Standard ASTM F1996 | Developed by Subcommittee: F01.18
Book of Standards Volume: 10.04
Historical (view previous versions of standard)
Significance and Use
The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
F1596 Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
F1689 Test Method for Determining the Insulation Resistance of a Membrane Switch
ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)