The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

1. Scope

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

F1596 Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity

F1689 Test Method for Determining the Insulation Resistance of a Membrane Switch

Keywords

membrane switch; silver dendrite; silver migration;

ICS Code

ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)

Citing ASTM Standards

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