Standard Withdrawn, No replacement   Last Updated: Jan 13, 2023 Track Document
ASTM F1996-14

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)

Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023) F1996-14 ASTM|F1996-14|en-US Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023) Standard new BOS Vol. 10.04 Committee F01
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Significance and Use

4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

Scope

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

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