ASTM F1996 - 14

    Standard Test Method for Silver Migration for Membrane Switch Circuitry

    Active Standard ASTM F1996 | Developed by Subcommittee: F01.18

    Book of Standards Volume: 10.04


      Format Pages Price  
    PDF 3 $38.00   ADD TO CART
    Hardcopy (shipping and handling) 3 $38.00   ADD TO CART
    Standard + Redline PDF Bundle 6 $45.60   ADD TO CART


    Significance and Use

    4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

    4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

    1. Scope

    1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

    1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.


    ICS Code

    ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)

    UNSPSC Code

    UNSPSC Code 39122200(Electrical switches and accessories)


    Referencing This Standard

    DOI: 10.1520/F1996-14

    ASTM International is a member of CrossRef.

    Citation Format

    ASTM F1996-14, Standard Test Method for Silver Migration for Membrane Switch Circuitry, ASTM International, West Conshohocken, PA, 2014, www.astm.org

    Back to Top