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    ASTM F1262M - 14

    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    Active Standard ASTM F1262M | Developed by Subcommittee: F01.11

    Book of Standards Volume: 10.04


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    Significance and Use

    5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.

    1. Scope

    1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.

    1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.

    1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


    UNSPSC Code

    UNSPSC Code


    Referencing This Standard

    DOI: 10.1520/F1262M-14

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    Citation Format

    ASTM F1262M-14, Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric), ASTM International, West Conshohocken, PA, 2014, www.astm.org

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