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ASTM E996 - 10


ASTM E996 - 10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy


Active Standard ASTM E996 Developed by Subcommittee: E42.03 |Book of Standards Volume: 03.06

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ASTM E996

Significance and Use

Include the experimental conditions under which spectra are taken in the Experiment section of all reports and publications.

Identify any parameters that are changed between different spectra in the Experiment section of publications and reports, and include the specific parameters applicable to each spectrum in the figure caption.

1. Scope

1.1 Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.

1.2 This practice lists the desirable information that shall be reported to fully describe the experimental conditions, specimen conditions, data recording procedures, and data transformation processes.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E673 Terminology Relating to Surface Analysis

E902 Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers

E983 Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

E995 Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

E1078 Guide for Specimen Preparation and Mounting in Surface Analysis

E1127 Guide for Depth Profiling in Auger Electron Spectroscopy



Keywords

Auger electron spectroscopy; surface analysis ; X-ray photoelectron spectroscopy; Auger electron spectroscopy (AES); Data analysis--spectrochemical; Recording/reporting data analysis results; Spectral data--metals/alloys; Surface analysis--spectrochemical analysis;



ICS Code

ICS Number Code 19.100 (Non-destructive testing)



DOI: 10.1520/E0996-10

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