Active Standard ASTM E721 | Developed by Subcommittee: E10.07
Book of Standards Volume: 12.02
Historical (view previous versions of standard)
Significance and Use
It is important to know the energy spectrum of the particular neutron source employed in radiation-hardness testing of electronic devices in order to relate radiation effects with device performance degradation.
This guide describes the factors which must be considered when the spectrum adjustment methodology is chosen and implemented. Although the selection of sensors (foils) and the determination of responses (activities) is discussed in Guide E720, the experiment should not be divorced from the analysis. In fact, it is advantageous for the analyst conducting the spectrum determination to be closely involved with the design of the experiment to ensure that the data obtained will provide the most accurate spectrum possible. These data include the following : (1) measured responses such as the activities of foils exposed in the environment and their uncertainties, (2) response functions such as reaction cross sections along with appropriate correlations and uncertainties, (3) the geometry and materials in the test environment, and (4) a trial function or prior spectrum and its uncertainties obtained from a transport calculation or from previous experience.
1.1 This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.
1.2 This guide provides guidance and criteria that can be applied during the process of choosing the spectrum adjustment methodology that is best suited to the available data and relevant for the environment being investigated.
1.3 This guide is to be used in conjunction with Guide E720 to characterize neutron spectra and is used in conjunction with Practice E722 to characterize damage-related parameters normally associated with radiation-hardness testing of electronic-semiconductor devices.
Note 1—Although Guide E720 only discusses activation foil sensors, any energy-dependent neutron-responding sensor for which a response function is known may be used (1).
Note 2—For terminology used in this guide, see Terminology E170.
1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E170 Terminology Relating to Radiation Measurements and Dosimetry
E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
E262 Test Method for Determining Thermal Neutron Reaction Rates and Thermal Neutron Fluence Rates by Radioactivation Techniques
E263 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron
E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel
E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E266 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Aluminum
E393 Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters
E523 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Copper
E526 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Titanium
E704 Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238
E705 Test Method for Measuring Reaction Rates by Radioactivation of Neptunium-237
E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)
E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)
E1018 Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)
E1297 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ICS Number Code 83.140.10 (Films and sheets)
UNSPSC Code 41111814(Neutron radiography examination equipment); 32111700(Semiconductor devices)