ASTM E673-03

    Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

    Withdrawn Standard: ASTM E673-03 | Developed by Subcommittee: E42.02

    WITHDRAWN, NO REPLACEMENT


      Format Pages Price  
    PDF 10 $51.60   ADD TO CART


    Withdrawn Rationale:

    This terminology is related to the various disciplines involved in surface analysis.

    Formerly under the jurisdiction of Committee E42 on Surface Analysis, this terminology was withdrawn in January 2012 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

    1. Scope

    1.1 This terminology is related to the various disciplines involved in surface analysis.

    1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).



    Referencing This Standard

    DOI: 10.1520/E0673-03

    ASTM International is a member of CrossRef.

    Citation Format

    ASTM E673-03, Standard Terminology Relating to Surface Analysis (Withdrawn 2012), ASTM International, West Conshohocken, PA, 2003, www.astm.org

    Back to Top