Active Standard ASTM E668 | Developed by Subcommittee: E10.07
Book of Standards Volume: 12.02
Historical (view previous versions of standard)
Significance and Use
4.1 Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements.
1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10−2 to 104 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 10−2 to 1010 Gy/s (1 to 1012 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. (See Practice E2450 for guidance in mixed fields.) Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E170 Terminology Relating to Radiation Measurements and Dosimetry
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
ICS Number Code 31.020 (Electronic components in general)
UNSPSC Code 32111700(Semiconductor devices)