ASTM E665-94

1.1 This practice covers a procedure for determining absorbed dose versus depth in materials exposed to the X-ray output of flash X-ray machines. It is applicable to all machines whose photon energy spectra have maximum energies ranging from 100 keV to 20 MeV. The determination provides information related to the photon spectrum from the flash X-ray machine. Specifically this measurement can be used for verifying expected X-ray spectra obtained from machine diagnostics and radiation transport calculations and for determining the appropriate equilibrator thickness to be used for dosimetric measurements.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

Absorbed radiation dose; Dosimetry; Energy deposition-ionizing radiation; Flash X-ray machines (FXR); Threshold detectors-100 keV to 20 MeV; X-irradiation; absorbed dose versus depth in materials exposed to flash X-ray machines,; practice;

Citing ASTM Standards

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