Standards

ASTM E427 - 95(2006)


ASTM E427 - 95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode)


Active Standard ASTM E427 Developed by Subcommittee: E07.08 |Book of Standards Volume: 03.03

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more info 7 pages $ 41.00

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ASTM E427

Significance and Use

Halogen leak testing can be used to indicate the presence, location and magnitude of leaks in a closed vessel. This test method is normally used for production examination. Its use with halogenated refrigerant gases has been declining because of concerns about the effect of these gases on the ozone layer.

1. Scope

1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 2.2 10 14 mol/s (5 1010 Std cm3/s). The test may be conducted on any device or component across which a pressure differential of halogen tracer gas may be created, and on which the effluent side of the area to be leak tested is accessible for probing with the halogen leak detector.

1.2 Five methods are described:

1.2.1 Method A - Direct probing with no significant halogen contamination in the atmosphere.

1.2.2 Method B - Direct probing with significant halogen contamination in the atmosphere.

1.2.3 Method C - Shroud test.

1.2.4 Method D - Air-curtain shroud test.

1.2.5 Method E Accumulation test.

1.3 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E1316 Terminology for Nondestructive Examinations

Other Documents

ANSI/ASNTCP-189 ASNT Standard for Qualification and Certification of Nondestructive Testing Personnel



Keywords

freon leak testing; halogen leak testing; heated anode halogen detection; leak testing;



ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)



DOI: 10.1520/E0427-95R06

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