Standards

ASTM E305 - 07


ASTM E305 - 07 Standard Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves


Active Standard ASTM E305 Developed by Subcommittee: E01.20 |Book of Standards Volume: 03.05

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ASTM E305

Significance and Use

This practice is intended as a fundamental guide for the calibration, standardization, and daily control of the analytical curves for atomic emission spectrometers.

It is assumed that this practice will be used by trained operators capable of performing the procedures described herein.

1. Scope

1.1 This practice provides guidance for establishing and controlling atomic emission spectrochemical analytical curves. The generation of analytical curves and their routine control are considered as separate although interrelated operations. This practice is applicable to atomic emission spectrometers.

Note 1

X-ray emission spectrometric applications are no longer covered by this practice. See Guides E 1361 and E 1621 for discussion of this technique.

1.1.1 Since computer programs are readily available to run multiple linear regressions that can be used to generate analytical curves and since most instruments include this feature, this practice does not go into detail on the procedure. However, some recommendations are given on evaluating the equations that are generated.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


2. Referenced Documents

ASTM Standards
E1329 Practice for Verification and Use of Control Charts in Spectrochemical Analysis
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
E1361 Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
E1621 Guide for X-Ray Emission Spectrometric Analysis


Index Terms

analytical curve; atomic emission; calibration; interferences; standardization, including multi-point; verification


DOI: 10.1520/E0305-07

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