This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.

1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:

2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

Other Documents

ASTM Standards

E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

E305 Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves

E1361 Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis

E1601 Practice for Conducting an Interlaboratory Study to Evaluate the Performance of an Analytical Method

E1622 Practice for Correction of Spectral Line Overlap in Wavelength-Dispersive X-Ray Spectrometry

Keywords

Ni-base alloys; spectrometric analysis; X-ray emission; X-ray fluorescence; Nickel alloys; X-ray spectrometry;

ICS Code

ICS Number Code 77.040.20 (Non-destructive testing of metals); 77.120.50 (Titanium and titanium alloys)

Citing ASTM Standards

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