Standard Active Last Updated: May 28, 2018 Track Document
ASTM E2444-11(2018)

Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films

Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films E2444-11R18 ASTM|E2444-11R18|en-US Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films Standard new BOS Vol. 03.01 Committee E08
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Scope

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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Details
Book of Standards Volume: 03.01
Developed by Subcommittee: E08.02
Pages: 2
DOI: 10.1520/E2444-11R18
ICS Code: 01.040.31; 31.240