This test method describes the temperature calibration of dielectric analyzers over the temperature range from –100 to 300 °C and is applicable to commercial and custom-built apparatus.
Formerly under the jurisdiction of Committee E37 on Thermal Measurements , this test method was withdrawn in September 2009 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.
1.1 This test method covers the temperature calibration of dielectric analyzers over the temperature range from -100 to 300°C and is applicable to commercial and custom-built apparatus. The calibration is performed by observing the melting transition of standard reference materials having known transition temperatures within the temperature range of use.
1.2 Electronic instrumentation or automated data analysis and data reductions systems or treatment equivalent to this test method may be used.
1.3 The values stated in SI units are to be reported as the standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use.
calibration; dielectric analyzers (DEA); melting; temperature; thermal analysis;
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