Significance and Use
These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes.
These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations.
Reticles may be calibrated as independent articles and as components of a microscope system.
1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures. Many materials engineering decisions may be based on qualitative and quantitative analyses of a microstructure. It is essential that microscope magnifications and reticle dimensions be accurate.
1.2 The calibration using these methods is only as precise as the measuring devices used. It is recommended that the stage micrometer or scale used in the calibration should be traceable to the National Institute of Standards and Technology (NIST) or a similar organization.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E7 Terminology Relating to Metallography
E112 Test Methods for Determining Average Grain Size
calibration; filar micrometer; grain size; magnification; microscope; photography; reticle; stage micrometer, video systems;
ICS Number Code 37.020 (Optical equipment)
ASTM International is a member of CrossRef.
Citing ASTM Standards
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