X-ray fluorescence spectrometry can provide an accurate and precise determination of metallic and many non-metallic elements. This guide covers the information that should be included in an X-ray spectrometric analytical method and provides direction to the analyst for determining the optimum conditions needed to achieve acceptable accuracy.

The accuracy of an analysis is a function of the calibration scheme, the sample preparation, and the sample homogeneity. Close attention to all aspects of these areas is necessary to achieve the best results.

1. Scope

1.1 This guide covers guidelines for developing and describing analytical procedures using a wavelength-dispersive X-ray spectrometer.

1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

E305 Practice for Establishing and Controlling Atomic Emission Spectrochemical Analytical Curves

E1257 Guide for Evaluating Grinding Materials Used for Surface Preparation in Spectrochemical Analysis

E1329 Practice for Verification and Use of Control Charts in Spectrochemical Analysis

E1361 Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis

E1601 Practice for Conducting an Interlaboratory Study to Evaluate the Performance of an Analytical Method

Keywords

interferences; line overlap; spectroscopy; X-ray

ICS Code

Citing ASTM Standards

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