You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    ASTM E1172 - 16

    Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

    Active Standard ASTM E1172 | Developed by Subcommittee: E01.20

    Book of Standards Volume: 03.05


      Format Pages Price  
    PDF 5 $44.00   ADD TO CART
    Hardcopy (shipping and handling) 5 $44.00   ADD TO CART
    Standard + Redline PDF Bundle 10 $52.80   ADD TO CART


    Significance and Use

    4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

    4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.

    1. Scope

    1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.

    1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.


    2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    ASTM Standards

    E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

    E416 Practice for Planning and Safe Operation of a Spectrochemical Laboratory

    E876 Practice for Use of Statistics in the Evaluation of Spectrometric Data


    ICS Code

    ICS Number Code 17.180.30 (Optical measuring instruments)

    UNSPSC Code

    UNSPSC Code 41115403(Spectrometers)


    Referencing This Standard
    Link Here
    Link to Active (This link will always route to the current Active version of the standard.)

    DOI: 10.1520/E1172-16

    ASTM International is a member of CrossRef.

    Citation Format

    ASTM E1172-16, Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer, ASTM International, West Conshohocken, PA, 2016, www.astm.org

    Back to Top