Standards

ASTM E1172 - 87(2011)


ASTM E1172 - 87(2011) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer


Active Standard ASTM E1172 Developed by Subcommittee: E01.20 |Book of Standards Volume: 03.05

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ASTM E1172

Significance and Use

This practice describes the essential components of a wavelength-dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

1. Scope

1.1 This practice covers the components of a wavelength-dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. The document does, however, attempt to identify which of these are critical and thus which should be specified.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.

1.3 There are several books and publications from the National Institute of Standards and Technology and the U.S. Government Printing Office , which deal with the subject of X-ray safety. Refer also to Practice E416.


2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials

E416 Practice for Planning and Safe Operation of a Spectrochemical Laboratory

E876 Practice for Use of Statistics in the Evaluation of Spectrometric Data



Keywords

spectroscopy; X-ray emission; X-ray spectrometer ;



ICS Code

ICS Number Code 17.180.30 (Optical measuring instruments)



DOI: 10.1520/E1172-87R11

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