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Significance and Use
This test method is used to evaluate the applicability of other ASTM test methods to a photovoltaic device.
The procedure described in this test method is intended to be used to determine the degree of linearity between the short-circuit current of a photovoltaic device and the irradiance level incident on the device. This test method can be used for other device parameters, provided the function passes through the origin.
1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance.
1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level.
1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices.
1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E772 Terminology of Solar Energy Conversion
E948 Test Method for Electrical Performance of Photovoltaic Cells Using Reference Cells Under Simulated Sunlight
E1036 Test Methods for Electrical Performance of Nonconcentrator Terrestrial Photovoltaic Modules and Arrays Using Reference Cells
E1328 Terminology Relating to Photovoltaic Solar Energy Conversion
ICS Number Code 27.160 (Solar energy engineering)
UNSPSC Code 32111701(Photovoltaic cells)
ASTM E1143-05(2010), Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter, ASTM International, West Conshohocken, PA, 2010, www.astm.orgBack to Top