| ||Format||Pages||Price|| |
|6||$44.00||  ADD TO CART|
|Hardcopy (shipping and handling)||6||$44.00||  ADD TO CART|
Significance and Use
This is a laboratory test designed to simulate the effects of (1) the presence of rough interfaces between conductor or semiconductive screen and primary insulation in an insulation system, (2) the presence of foreign particles (contaminants) in an insulation system, and (3) the presence of small voids or cavities within the insulation.
This test method provides comparative data. The degree of correlation with actual performance in service has not been established.
1.1 This test method covers the evaluation and comparison of the resistance of solid organic dielectric materials to the initiation or growth, or both, of tubular tree-like channels resulting from partial discharge (corona) and molecular decomposition that occur in the region of very high, diverging electric fields. ,
1.2 This test method is primarily for use at a power frequency of 50 or 60 Hz.
1.3 The test may be carried out at room temperature or temperatures above or below room temperature. The temperature should not exceed the softening or melting point of the sample material.
1.4 This test method can be used for any solid material into which needles can be cast, molded, or inserted with heat after molding. The resistance to tree initiation is measured by the double-needle characteristic voltage, which is only applicable to non-opaque materials so that tree can be observed optically. The resistance to tree initiation and growth is reported by the double-needle voltage life, which is applicable to both opaque and non-opaque materials.
1.5 The values stated in SI units are to be regarded as the standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
Other DocumentANSI/IEEE 930-1987 IEEE Guide for the Statistical Analysis of Electrical Insulation Voltage Endurance Data Available from American National Standards Institute (ANSI), 25 W. 43rd St., 4th Floor, New York, NY 10036.
D149 Test Method for Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies
D1711 Terminology Relating to Electrical Insulation
D1928 Practice for Preparation of Compression-Molded Polyethylene Test Sheets and Test Specimens
D2275 Test Method for Voltage Endurance of Solid Electrical Insulating Materials Subjected to Partial Discharges (Corona) on the Surface
ICS Number Code 29.035.01 (Insulating materials in general)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM D3756-97(2010), Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields, ASTM International, West Conshohocken, PA, 2010, www.astm.orgBack to Top