| ||Format||Pages||Price|| |
|5||$43.00||  ADD TO CART|
|Hardcopy (shipping and handling)||5||$43.00||  ADD TO CART|
Significance and Use
4.1 This experimental procedure yields meaningful data for the dc volume resistivity of glass. It is designed to minimize space charge, buildup polarization effects, and surface conductances. The temperature range is limited to room temperature to the annealing point of the specimen glass.
1.1 This test method covers the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge, buildup polarization current.
1.2 This test method is intended for the determination of resistivities less than 1016 Ω·cm in the temperature range from 25°C to the annealing point of the glass.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
D257 Test Methods for DC Resistance or Conductance of Insulating Materials
D374 Test Methods for Thickness of Solid Electrical Insulation
D1711 Terminology Relating to Electrical Insulation
D1829 Test Method for Electrical Resistance of Ceramic Materials at Elevated Temperatures Withdrawn. The last approved version of this historical standard is referenced on www.astm.org.
ICS Number Code 81.040.10 (Raw materials and raw glass)
ASTM C657-93(2013), Standard Test Method for D-C Volume Resistivity of Glass, ASTM International, West Conshohocken, PA, 2013, www.astm.orgBack to Top