Active Standard ASTM B854 | Developed by Subcommittee: B02.11
Book of Standards Volume: 02.04
Historical (view previous versions of standard)
Significance and Use
This guide suggests techniques to evaluate intermittences in a contact pair while it is subjected to simulated or actual environmental stress. Such measurements are a valuable tool in predicting circuit performance under these stress conditions and in diagnosing observed problems in circuit function under such conditions.
This document is intended to provide some general guidance on the best available practices for detecting, quantifying, characterizing and reporting short duration intermittences in circuits containing electrical contacts. Certain environmental stresses such as mechanical shock, vibration or temperature change may cause intermittences. These measurement procedures include methods applicable to contacts operating under various conditions in testing or in service.
Practice B615 defines methods for measuring electrical contact noise in sliding electrical contacts. In contrast Guide B854 provides guidance to the various methods for measuring similar phenomena in static contacts.
1.1 The techniques described in this guide apply to electrical circuits that include one or more electrical contacts in devices such as slip rings, separable connectors, electromechanical relays or closed switch contacts. The user should determine applicability for other devices.
1.2 The range of techniques described apply to circuit discontinuities (intermittences) of durations ranging from approximately 10 nanoseconds to several seconds and of sufficient magnitude to cause alteration of the circuit function. Extension of the guide to shorter duration events may be possible with suitable instrumentation. Events of longer duration may be monitored by techniques for dc measurements such as those described in Test Methods B539 or by adaptation of methods described in this guide.
1.3 The techniques described in this guide apply to electrical circuits carrying currents typical of signal circuits. Such currents are generally less than 100 ma. Extension of these techniques to circuits carrying larger currents may be possible, but the user should evaluate applicability first.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety and health practices, and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
B539 Test Methods for Measuring Resistance of Electrical Connections (Static Contacts)
B542 Terminology Relating to Electrical Contacts and Their Use
B615 Practice for Measuring Electrical Contact Noise in Sliding Electrical Contacts
B878 Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Other DocumentsEIA-364-46 Continuity Test Procedure for Electrical Connectors Available from Electronic Industries Association, 2001 Pennsylvania Ave NW, Washington D.C. 20006.
ICS Number Code 29.120.20 (Connecting devices)