Symposia / General Information

D02F000 Manufactured Carbon and Graphite Products
Pre-registration requested to attend this meeting.

ABOUT THE EVENT

A Symposium on Graphite Testing for Nuclear Applications: the Significance of Test Specimen Volume and Geometry and the Statistical Significance of Test Specimen Population, will be held September 19-20, 2013 following the 14th International Nuclear Graphite Specialist meeting. Sponsored by ASTM Committee D02 on Manufactured Carbon and Graphite Products, the symposium will be held at the Seattle Hilton in Seattle, Washington.

Objective
Currently, the most comprehensive set of test standards for graphite has been published by ASTM International. These standards and practices have been devised principally to meet the requirements of graphite manufacturers who generally do not have constraints on test sample volume or geometry. In addition, industry looks for guidance as to how many specimens should be tested to constitute a valid test.

However, materials testing for nuclear reactor applications (design and operation) tends to have rather severe constraints relative to the test specimen size, and the number of specimens in a data set is usually limited. These constraints on test specimen size can result in non-compliant application of published standards. Furthermore, constraints imposed by current standards (such as sample volume to grain size limitations) are poorly understood and not supported by rigorous experimental evidence. New data and deeper scientific understanding is needed to support new and updated standards with specific nuclear application.

The symposium, which will focus on the testing of as-manufactured graphite, has four principal objectives:

    1. To collect evidence on test specimen size effects for a range of properties, test specimen geometries and test specimen volumes, with a view to collating data into a single reference.
    2. To provide a technical (theoretical and/or experimental) basis for restrictions on test specimen size in
    ASTM standards.
    3. To provide guidance on the number of tests necessary for a valid measure of a given property.
    4. To consider development of new standards.

The program of the symposium is as follows:

Day 1: The validity of small sample testing by theoretical and experimental work.
Day 2 (0.5 day): The statistical significance of the number of specimens tested for a valid test.

Invited speakers will each give a 30 minute presentation which will be followed by a 15 minute questions and answers session. Each presentation will be accompanied by a paper that will be peer reviewed and published as part of an ASTM Selected Technical Papers (STP) publication covering the event.

The language of the symposium will be English.

TECHNICAL PROGRAM

A technical program (presentation times, paper titles, and presenters' names) will be posted on the ASTM website by late July 2013.

Symposium Schedule: Thursday, 8:00 AM - 5:00 PM
Friday, 8:00 AM - 12:15 PM

REGISTRATION INFORMATION

Online registration opens approximately 8 weeks before the symposium and closes September 19, 2013. The fees to attend this symposium are listed below. These fees include:

    -the Wednesday evening reception and
    -the Thursday luncheon

Students – A student's fee is waived, provided that he/she is a full-time student and is not employed full time. After registering online, the student must check in at the ASTM Registration Desk on site and present his/her student ID. The waived fee includes admission to the technical sessions, but does not include the social events described above.

All attendees, including presenters and ASTM members, are urged to register online for this event so that space requirements can be accommodated. If you do not register online by the closing date, then you must register upon arrival at the symposium. All attendees must check in at the ASTM registration desk upon arrival at symposium.

Cancellations
A refund of the symposium fee will be honored only if requested at least 7 business days prior to the symposium. To cancel your registration and request a refund, please contact Hannah Sparks at hsparks@astm.org or 610-832-9678.

If you have questions concerning online registration, please contact Hannah Sparks in Symposia Operations at hsparks@astm.org, Tel: 610/832-9677, or ASTM Technical Support at support@astm.org or 1-800-262-1373 (domestic) or 610-832-9578 (international).

 

Online

On Site

ASTM Member Fee
Non-Member Fee
Presenter Fee
Student Fee
$185.00
$210.00
$185.00
Waived
$185.00
$210.00
$185.00
Waived

CONTINUING EDUCATION UNITS

Symposium attendees interested in receiving 1.05 Continuing Education Units (CEUs) should complete a CEU application form at the adjournment of the symposium, and then submit it to the ASTM staff member on site. A certificate will be sent to the attendee approximately 4 to 6 weeks after the symposium.

TECHNICAL CHAIR CONTACT INFORMATION

Additional information about the symposium is available from Symposium Co-Chairmen Tim Burchell, Oak Ridge National Laboratory, Oak Ridge, TN, burchelltd@ornl.gov, 865-576-8595; William Windes, Idaho National Laboratory, Idaho Falls, ID, William.windes@inl.gov, 208-526-6985; Nassia Tzelepi, National Nuclear Laboratory, Seascale, Great Britain, nassia.tzelepi@nnl.co.uk, 44 7894836532, and Steve Duffy, Cleveland State University, Stow, OH, sduffy@crtechnologies.com, 330-388-0511.

HOTEL INFORMATION

Reservations can be made directly with the hotel by calling 206-695-6003 or through the Hilton's central reservations department at 1-800-445-8667. When booking a room please request the group rate for the INGSM-14/ASTM Symposium.

STANDARDS DEVELOPMENT MEETINGS

Meeting schedules of Committee D02 are posted on the ASTM web site at www.astm.org/COMMIT/COMMITTEE/D02.htm or contact the ASTM staff manager, Dave Bradley at dbradley@astm.org or tel: 610 -832-9681.

FUTURE MEETING DATES

Committee D02 invites you to attend their future standards development meetings. There is no fee to attend these meetings, and membership in ASTM International is not required. For more information, visit the web listed immediately above, and click "Future Meetings".