F01 (13-01)

    Item No.Sub No.Item
    1.03Reapproval of F0015-2004(2009) Specification for Iron-Nickel-Cobalt Sealing Alloy WK39822
    2.03Reapproval of F0073-1996(2009) Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps WK39823
    3.03Reapproval of F0083-1971(2009) Practice for Definition and Determination of Thermionic Constants of Electron Emitters WK39824
    4.03Reapproval of F0085-1976(2009) Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes WK39825
    5.03Reapproval of F0204-1976(2009) Test Method for Surface Flaws in Tungsten Seal Rod and Wire WK39826
    6.03Reapproval of F0219-1996(2009) Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps WK39827
    7.11Reapproval of F0615M-1995(2008) Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) WK40823
    8.18Revision With Title Change to F1995-2012 Test Method for Determining the Shear Force of a Surface Mount Device (SMD) in a Membrane Switch WK40336
    9.18Revision Of F1996-2006 Test Method for Silver Migration for Membrane Switch Circuitry WK40334
    10.18Revision Of F2073-2001(2006) Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch WK40578