Society Review / F01 (12-01)

Item No.
Sub No.
Item

1

.03
Reapproval of F0029-1997(2009) Specification for Dumet Wire for Glass-to-Metal Seal Applications WK36614

2

.03
Reapproval of F0030-1996(2009) Specification for Iron-Nickel Sealing Alloys WK36615

3

.03
Revision With Title Change to F0031-2005(2010) Specification for 42 % Nickel-6 % Chromium-Iron Sealing Alloy WK31765

4

.10
Reapproval of F1094-1987(2005) Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method WK37686

5

.10
Reapproval of F1372-1993(2005) Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components WK37687

6

.10
Reapproval of F1373-1993(2005) Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components WK37688

7

.10
Reapproval of F1374-1992(2005) Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components WK37689

8

.10
Reapproval of F1375-1992(2005) Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components WK37690

9

.10
Reapproval of F1376-1992(2005) Guide for Metallurgical Analysis for Gas Distribution System Components WK37692

10

.10
Reapproval of F1394-1992(2005) Test Method for Determination of Particle Contribution from Gas Distribution System Valves WK37694

11

.10
Reapproval of F1396-1993(2005) Test Method for Determination of Oxygen Contribution by Gas Distribution System Components WK37696

12

.10
Reapproval of F1397-1993(2005) Test Method for Determination of Moisture Contribution by Gas Distribution System Components WK37697

13

.10
Reapproval of F1398-1993(2005) Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components WK37699

14

.10
Reapproval of F1438-1993(2005) Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components WK37700

15

.11
Revision Of F1892-2006 Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices WK24205

16

.18
Test Method For Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device WK34751