|November Plenary Talk Will Explore Needs of Surface Analysts and Clients |
When ASTM Committee E42 on Surface Analysis meets in Denver next month, its activities will include a plenary talk, Looking at Practical Standards for Surface Analysis, by Robert M. Wallace, Department of Materials Science, University of North Texas. The talk, which is free and open to the public, begins 3 p.m., Nov. 3, at the Adams Mark Hotel.
Wallace will examine ideas for practical standards that address the needs of analysts and their customers. He will discuss areas where standards and procedures may be useful, as in thin dielectric metrology, coatings, and diffusion profiles.
According to Committee E42 official Horatio S. Wildman, IBM Corporation, Hopewell Junction, N.Y., Surface analysis has become a key component in the manufacturing processes in many industries. Analytical techniques have required the development of standards or procedures that are typically specialized to a particular application or product.
ASTM Committee E42 enables a broad representation of stakeholders to develop, by voluntary consensus, a common set of standards and procedures that address the interests of industry, government, and academia. The committee coordinates the development and review of standards for the most widely used methods of surface analysis by photon, electron, and ion emission or reflection methods. Typical methods include: Auger-electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion-mass spectrometry, and the use of ion bombardment and other methods to obtain composition vs. depth information.
For further technical information, contact committee chairman Alvin W. Czanderna, Denver, Colo. (phone: 303/986-1234). To learn more about Committee E42 meetings or membership activities, contact Gloria Collins, manager, Technical Committee Operations, ASTM International (phone: 610/832-9715). //
Copyright 2002, ASTM
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