NEW STANDARD
Volume 10.05, 2004
F 2114-02, Guide for ASTM Standard Test Methods, Standard Practices, and Typical Values of a Membrane Switch

REVISION OF STANDARD
Volume 10.05, 2004
F 950-02, Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching
F 1390-02, Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning
F 1529-02, Test Method for Sheet Resistance Uniformity Evaluation by In-line Four-Point Probe with the Dual-Configuration Procedure
F 1530-02, Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
F 1725-02, Guide for Analysis of Crystallographic Perfection of Silicon Ingots
F 1727-02, Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
Volume 10.05, 2004
F 28-02, Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay F 42-02, Test Methods for Conductivity Type of Extrinsic Semiconducting Materials
F 84-02, Test Method for Measuring Resistivity of Silicon Wafers with an In-Line Four-Point Probe
F 374-02, Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and
Ion-Implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
F 391-02, Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
F 397-02, Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
F 523-02, Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
F 533-02a, Test Method for Thickness and Thickness Variation of Silicon Wafers
F 534-02a, Test Method for Bow of Silicon Wafers
F 673-02, Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage
F 847-02, Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
F 1049-02, Practice for Shallow Etch Pit Detection on Silicon Wafers F 1188-02 (Includes change to title), Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline
F 1392-02, Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a
Mercury Probe
F 1393-02, Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements with a Mercury Probe
F 1726-02, Guide for Analysis of Crystallographic Perfection of Silicon Wafers
F 1809-02, Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
F 1812-02, Test Method for Determining the Effectiveness of Membrane Switch Esd Shielding
F 1842-02, Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications

REAPPROVAL OF STANDARD
Volume 10.05, 2004
E 1392-96 (2002)
F 398-92 (2002)
F 728-81 (2003)
F 1153-92 (2002)
F 1366-92 (2002)
F 1617-98 (2002)
F 1763-96 (2002)
F 1771-97 (2002)
F 1810-97 (2002)
F 1811-97 (2002)
F 1843-97 (2002)

F02 on Flexible Barrier Materials

NEW STANDARD
Volume 15.09, 2003
F 2227-02, Test Method for Non-Destructive Detection of Leaks in Non-Sealed and Empty Medical Packaging Trays by Co
F 2228-02, Test Method for Non-Destructive Detection of Leaks in Medical Packaging Which Incorporates Porous Barrier Material by Co

REAPPROVAL OF STANDARD
Volume 15.09, 2003
E 171-94 (2002)
F 119-82 (2002)
F 1306-90 (2002)
F 1317-98 (2002)

F05 on Business Imaging Products

REVISION OF STANDARD
Volume 15.09, 2003
F 335-03, Terminology Relating to Electrostatic Imaging
F 577-03, Test Method for Particle Size Measurement of Dry Toners

REAPPROVAL OF STANDARD
Volume 15.09, 2002
F 149-92b(2003)
F 597-83 (2003)
F 843-98 (2003)
F 854-83 (2003)
F 1151-88 (2003)
F 1232-98 (2003)
F 1442-92 (2003)
F 1443-93 (2003)
F 1571-95 (2002)
F 1782-97 (2002)

WITHDRAWAL OF STANDARD
Volume 15.09, 2003
F 425-93(1997), Terminology Relating to Lithographic Copy Products

F06 on Resilient Floor Coverings

REVISION OF STANDARD
Volume 15.04, 2003
F 1265-03, Test Method for Resistance to Impact for Resilient Floor Tile
Volume 15.04, 2003
F 1482-03 (Includes change to title), Practice for Installation and Preparation of Panel Type Underlayments to Receive Resilient Flooring

F07 on Aerospace and Aircraft

REVISION OF STANDARD
Volume 15.03, 2003
F 1105-03, Test Method for Preparing Aircraft Cleaning Compounds, Liquid-Type, Temperature-Sensitive, or Solvent-Based, for Storage Stability Testing

F14 on Fences

REVISION OF STANDARD
Volume 01.06, 2002
F 654-03, Specification for Residential Chain Link Fence Gates
Volume 01.06, 2003
F 900-03, Specification for Industrial and Commercial Swing Gates
F 1184-03, Specification for Industrial and Commercial Horizontal Slide Gates

F15 on Consumer Products

NEW STANDARD
Volume 15.07, 2003
F 2236-03, Consumer Safety Specification for Soft Infant Carriers
PS 10-03, Provisional Specification for Manufactured Safety Vacuum Release Systems (SVRS) for Swimming Pools, Spas and Hot Tubs

REVISION OF STANDARD
Volume 15.07, 2003
F 977-03, Consumer Safety Specification for Infant Walkers
F 1561-03, Performance Requirements for Plastic Chairs for Outdoor Use

F24 on Amusement Rides and Devices

REVISION OF STANDARD
Volume 15.07, 2003
F 1159-03, Practice for Design and Manufacture of Patron Directed, Purposeful Water Immersion, and Coin Operated Amusement Rides and Devices, Artificial Climbing Walls, Dry Slides, and Air Supported Structures
F 1193-03, Practice for Amusement Ride and Device Manufacturer Quality Assurance Program and Manufacturing Requirements

F26 on Food Service Equipment

REVISION OF STANDARD
Volume 15.08, 2003
F 1126-03, Specification for Food Cutters, Electric

F29 on Anesthetic and Respiratory Equipment

WITHDRAWAL OF STANDARD
Volume 13.01, 2003
F 960-86(2000), Specification for Medical and Surgical Suction and Drainage Systems

F30 on Emergency Medical Services

REAPPROVAL OF STANDARD
Volume 13.01, 2003
F 1118-91 (2003)
F 1381-92 (2003)

F34 on Rolling Element Bearings

REAPPROVAL OF STANDARD
Volume 01.08, 1998
D 3337-91 (2002)