| F01 on Electronics
• NEW STANDARD
Volume 10.05, 2003
F 2166-02, Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers
• REVISION OF STANDARD
Volume 10.04, 2003
F 3-02, Specification for Nickel Strip for Electron Tubes
Volume 10.05, 2003
F 154-02, Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
F 533-02, Test Method for Thickness and Thickness Variation of Silicon Wafers
F 534-02, Test Method for Bow of Silicon Wafers
F 928-02, Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
F 951-02, Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
F 978-02, Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
F 1152-02, Test Method for Dimensions of Notches on Silicon Wafers
F 1239-02 (Includes change to title), Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
F 1680-02, Test Method for Determining Circuit Resistance of a Membrane Switch
F 1682-02, Test Method for Determining Travel of a Membrane Switch
F 1683-02 (Includes change to title), Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component
F 1689-02, Test Method for Determining the Insulation Resistance of a Membrane Switch
F 1708-02, Practice for Evaluation of Granular Polysilicon by Melter-Zoner Spectroscopies
F 1723-02, Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
F 1762-02, Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
• REAPPROVAL OF STANDARD
Volume 10.04, 2003
F 30-96 (2002)
F 73-96 (2002)
F 83-71 (2002)
F 111-96 (2002)
F 204-76 (2002)
F 219-96 (2002)
F 269-60 (2002)
F 288-96 (2002)
F 289-96 (2002)
F 364-96 (2002)
Volume 10.05, 2003
F 1598-95 (2002)
F 1661-96 (2002)
F 1662-95 (2002)
F 1663-95 (2002)
F 1681-96 (2002)
F03 on Gaskets
• REVISION OF STANDARD
Volume 09.02, 2002
F 1087-02, Test Method for Linear Dimensional Stability of a Gasket Material to Moisture
• REAPPROVAL OF STANDARD
Volume 09.02, 2002
F 152-95 (2002)
F04 on Medical and Surgical Materials and Devices
• NEW STANDARD
Volume 13.01, 2001
F 2151-01, Practice for Assessment of White Blood Cell Morphology After Contact with Materials
F07 on Aerospace and Aircraft
• REAPPROVAL OF STANDARD
Volume 15.03, 2001
D 2507-93 (2001)
D 2539-93 (2001)
D 2540-93 (2001)
D 2541-93 (2001)
F12 on Security Systems and Equipment
• NEW STANDARD
Volume 15.08, 2002
F 2155-01, Specification for Performance of Hasps and Other Attachment Devices for Padlocks or Seals
• REAPPROVAL OF STANDARD
Volume 15.08, 2002
F 471-76 (2002)
F 476-84 (2002)
F13 on Safety and Traction for Footwear
• REVISION OF STANDARD
Volume 15.07, 2002
F 1646-02, Terminology Relating to Safety and Traction for Footwear
F17 on Plastic Piping Systems
• NEW STANDARD
Volume 08.04, 2002
F 2158-01, Specification for Residential Central-vacuum Tube and Fittings
• REVISION OF STANDARD
Volume 08.04, 2001
D 2837-01a, Test Method for Obtaining Hydrostatic Design Basis for Thermoplastic Pipe Materials
Volume 08.04, 2002
F 1741-02, Practice for Installation of Machine Spiral Wound Poly Vinyl Chloride PVC Liner Pipe for Rehabilitation of Existing Sewers and Conduits
F29 on Anesthetic and Respiratory Equipment
• WITHDRAWAL OF STANDARD
Volume 13.01, 2002
F 896-90(1999), Specification for Flexible Fiberoptic Bronchoscopes
F30 on Emergency Medical Services
• REVISION OF STANDARD
Volume 13.01, 2002
F 2020-02, Practice for Design, Construction, and Procurement of Emergency Medical Services Systems (EMSS) Ambulances
• REAPPROVAL OF STANDARD
Volume 13.01, 2002
F 1086-94 (2002)
F 1255-90 (2002)
F 1517-94 (2002)
F 1555-94 (2002)
F 1556-94 (2002)
F 1557-94 (2002)
F 1558-94 (2002)
F 1559-94 (2002)
F 1616-95 (2002)
F 1629-95 (2002)
F 1651-95 (2002)
F 1652-95 (2002)
F 1653-95 (2002)
F 1654-95 (2002)
F 1655-95 (2002)
Copyright 2002, ASTM
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