Electrical Insulation and Electronics

    STP1530 Lead-free Solders

    STP1382 Gate Dielectric Integrity: Material, Process, and Tool Qualification

    STP1376 Electrical Insulating Materials: International Issues

    STP1340 Recombination Lifetime Measurements in Silicon

    STP1139 Acoustic Emission Testing of Aerial Devices and Associated Equipment Used in the Utility Industries

    STP1141 Laser-Induced Damage in Optical Materials: 1990

    STP990 Semiconductor Fabrication: Technology and Metrology

    STP998 Electrical Insulating Oils

    STP1038 Laser Induced Damage in Optical Materials: 1987

    STP1028 Laser Induced Damage in Optical Materials: 1986

    STP1015 Laser Induced Damage in Optical Materials: 1985

    STP960 Emerging Semiconductor Technology

    STP926 Engineering Dielectrics Volume IIB Electrical Properties of Solid Insulating Materials: Measurement Techniques

    STP926 Engineering Dielectrics Volume IIB: Electrical Properties of Solid Insulating Materials: Measurement Techniques

    STP954 Laser Induced Damage in Optical Materials: 1984

    STP911 Laser Induced Damage In Optical Materials: 1983

    STP850 Semiconductor Processing

    STP804 Silicon Processing

    STP799 Laser Induced Damage in Optical Materials: 1981

    STP783 Engineering Dielectrics Volume IIA Electrical Properties of Solid Insulating Materials: Molecular Structure and Electrical Behavior

    STP759 Laser Induced Damage In Optical Materials: 1980

    STP712 Lifetime Factors in Silicon

    STP689 Laser Induced Damage in Optical Materials: 1978

    STP669 Engineering Dielectrics Volume I Corona Measurement and Interpretation

    STP666 Optical Interferograms—Reduction and Interpretation