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• STP1376 Electrical Insulating Materials: International Issues
• STP1382 Gate Dielectric Integrity: Material, Process, and Tool Qualification
• STP1340 Recombination Lifetime Measurements in Silicon
• STP1139 Acoustic Emission Testing of Aerial Devices and Associated Equipment Used in the Utility Industries
• STP1141 Laser-Induced Damage in Optical Materials: 1990
• STP990 Semiconductor Fabrication: Technology and Metrology
• STP1015 Laser Induced Damage in Optical Materials: 1985
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