SEDL / Topics / Metals Test Methods and Analytical Procedures / Metals -- Mechanical Testing; Elevated and Low-Temperature Tests; Metallography / Recent 25 STP


  • STP1311 Computerization and Networking of Materials Databases: Fifth Volume
  • STP1165 Metallography: Past, Present, and Future (75th Anniversary Volume)
  • STP1094 MiCon 90: Advances in Video Technology for Microstructural Control
  • STP979 MiCon 86: Optimization of Processing, Properties, and Service Performance Through Microstructural Control
  • STP889 Microindentation Techniques in Materials Science and Engineering
  • STP839 Practical Applications of Quantitative Metallography
  • STP792 MiCon 82: Optimization of Processing, Properties, and Service Performance Through Microstructural Control
  • STP672 MiCon 78: Optimization of Processing, Properties, and Service Performance Through Microstructural Control
  • STP557 Metallography—A Practical Tool for Correlating the Structure and Properties of Materials
  • STP547 Manual on Electron Metallography Techniques
  • STP504 Stereology and Quantitative Metallography
  • STP485 Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis
  • STP480 Applications of Modern Metallographic Techniques
  • STP430 Fifty Years of Progress in Metallographic Techniques
  • STP396 Advances in Electron Metallography: Vol. 6
  • STP394 Fire and Explosion Hazards of Peroxy Compounds
  • STP372 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
  • STP339 Symposium on Advances in Techniques in Electron Metallography
  • STP355 List of Alloy Phase Designations of the X-ray Diffraction Data File Sections 1–12
  • STP317 Symposium on Advances in Electron Metallography and Electron Probe Microanalysis
  • STP262 Symposium on Electron Metallography
  • STP285 Symposium on Methods of Metallographic Specimen Preparation
  • STP245 Symposium on Advances in Electron Metallography
  • STP155 Symposium on Techniques for Electron Metallography
  • STP157 Symposium on Fluorescent X-ray Spectrographic Analysis
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