Digital Library / Topics / Electrical Insulation and Electronics / Recent 25 JTE

• Evaluation of A Humidity Sensor for Use in An Environment Exposed to Radiation
• Comparative Survey of the DCT and the Wavelet Transforms for Image Compression
• Surface Roughness Measurement Using Laser Speckle Statistical Analysis
• Thermal Control of the Test Liquid in Vibratory Cavitation Erosion Tests
• Failure Analysis Using Microfocus X-ray Imaging
• Testing and Design of CMOS D-Latches
• Metallized Microballoon Filled Composite EMI Shielding Materials
• Laser Evaluation of Cutting Angle and Surface Finish in Scalpel Blades
• Room Temperature Capacitance and Dissipation Factor Measurement of Chip CapacitorsAn Interlaboratory Evaluation
• Strength Reduction in Thin Aluminum Alloy Sheets by Laser Irradiation
• Arc Tracking in Organic Insulating Materials and the Comparative Tracking Index
• Correlation Between Leaking Glass/Metal Seals and Wire Defects in Dry Reed Contacts
• Guard-Gap Correction for Guarded-Electrode Measurements and Exact Equations for the Two-Fluid Method of Measuring Permittivity and Loss
• A Technique for Examining Submicron Particulate Matter on Semiconductor Device Wafers
• Laser-Heating-Induced Failure of Metal Alloys Under Constant Stress
• Application of the Laser Beam Technique to the Improvement of Metal Strength
• Measurements in Silicon Planar Technology: Mechanical Properties of Semiconductor Surfaces
• Materials for Diffusion and Epitaxy
• Epitaxial Resistivity
• Silicon Epitaxial Thickness Measurements: Why and How
• Acquisition of Computer Aided Design/Analysis Models for Semiconductors
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