Electrical Insulation and Electronics

    A Certain Investigation on Harmonic Reduction and Design of Fuzzy Gain Scheduler for Shunt Compensation for Power Quality Enhancement

    Evaluation of the Morphological, Electrical, and Mechanical Properties of Silver Nanopastes

    A Novel Non-Destructive Evaluation (NDE) Technique Using Coplanar Capacitive Imaging Probes

    Concentration Effect on Photoluminescence Tests of the CdSe Colloid Nanocrystal System

    Stress State of GaN Epilayer Grown on Sapphire and 6H-SiC Substrates

    Dynamic Software Testing and Evaluation With State Space Method

    Edge Correction in Calculation of Dielectric Constant

    Simulation of Four-Point Test for DC Electrical Resistivity of Moderately Conductive Solids—Error due to Nonideal Specimen Size and Current Electrode Configuration

    Evaluation of A Humidity Sensor for Use in An Environment Exposed to Radiation

    Comparative Survey of the DCT and the Wavelet Transforms for Image Compression

    Surface Roughness Measurement Using Laser Speckle Statistical Analysis

    Thermal Control of the Test Liquid in Vibratory Cavitation Erosion Tests

    Failure Analysis Using Microfocus X-ray Imaging

    Testing and Design of CMOS D-Latches

    Metallized Microballoon Filled Composite EMI Shielding Materials

    Laser Evaluation of Cutting Angle and Surface Finish in Scalpel Blades

    Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation

    Strength Reduction in Thin Aluminum Alloy Sheets by Laser Irradiation

    Arc Tracking in Organic Insulating Materials and the Comparative Tracking Index

    Correlation Between Leaking Glass/Metal Seals and Wire Defects in Dry Reed Contacts

    Guard-Gap Correction for Guarded-Electrode Measurements and Exact Equations for the Two-Fluid Method of Measuring Permittivity and Loss

    A Technique for Examining Submicron Particulate Matter on Semiconductor Device Wafers

    Laser-Heating-Induced Failure of Metal Alloys Under Constant Stress

    Application of the Laser Beam Technique to the Improvement of Metal Strength

    Measurements in Silicon Planar Technology: Mechanical Properties of Semiconductor Surfaces