F01 on Electronics

    Title: Gate Dielectric Integrity: Material, Process, and Tool Qualification

    Location: San Jose, California

    Date: January 25 1999 - January 25 1999


    Title: Recombination Lifetime Measurements in Silicon

    Location: Santa Clara, CA

    Date: June 02 1997 - June 03 1997


    Title: Laser-Induced Damage in Optical Materials: 1990

    Location: Boulder, Colorado

    Date: October 24 1990 - October 26 1990


    Title: Semiconductor Fabrication: Technology and Metrology

    Location: Santa Clara, California

    Date: February 01 1988 - February 05 1988


    Title: Laser Induced Damage in Optical Materials: 1987

    Location: Boulder, Colorado

    Date: October 26 1987 - October 28 1987


    Title: Laser Induced Damage in Optical Materials: 1986

    Location: Boulder, Colorado

    Date: November 03 1986 - November 05 1986


    Title: Emerging Semiconductor Technology

    Location: San Jose, California

    Date: January 28 1986 - January 31 1986


    Title: Laser Induced Damage in Optical Materials: 1985

    Location: Boulder, Colorado

    Date: October 28 1985 - October 30 1985


    Title: Laser Induced Damage in Optical Materials: 1984

    Location: National Bureau of Standards (NBS), Boulder, Colorado

    Date: October 15 1984 - October 17 1984


    Title: Semiconductor Processing

    Location: San Jose, California

    Date: February 07 1984 - February 10 1984


    Title: Laser Induced Damage In Optical Materials: 1983

    Location: Boulder, Colorado

    Date: November 14 1983 - November 16 1983


    Title: Silicon Processing

    Location: San Jose, California

    Date: January 19 1982 - January 22 1982


    Title: Laser Induced Damage In Optical Materials: 1981

    Location: Boulder, Colorado

    Date: November 17 1981 - November 18 1981


    Title: Laser Induced Damage In Optical Materials: 1980

    Location: Boulder, Colorado

    Date: September 30 1980 - October 01 1980


    Title: Lifetime Factors in Silicon

    Location: San Diego, Calif.

    Date: February 15 1979 - February 16 1979


    Title: Laser Induced Damage in Optical Materials: 1978

    Location: Boulder, Colorado

    Date: September 12 1978 - September 14 1978


    Title: Reduction and Interpretation of Interferograms

    Location: Ft. Lauderdale, Fla.

    Date: January 11 1978 - January 11 1978


    Title: Semiconductor Measurement Technology: Spreading Resistance Symposium

    Location: Gaithersburg, Maryland

    Date: June 13 1974 - June 14 1974


    Title: Damage in Laser Glass

    Location: National Bureau of Standards in Boulder, Colo.

    Date: June 20 1969 - June 20 1969


    Title: Symposium on Cleaning and Materials Processing for Electronics and Space Apparatus

    Location: Los Angeles, Calif.

    Date: October 01 1962 - October 03 1962


    Title: Materials and Electron Device Processing

    Location: Philadelphia, Pa.

    Date: April 05 1961 - April 07 1961