SEDL / STP / STP748-EB

STP748
Methods and Models for Predicting Fatigue Crack Growth Under Random Loading

Chang JB, Hudson CM
Pages: 146
Published: 1981

PDF (2.1M): $55
Print: $55
Print + PDF: $82.50
Save 25%!

This book describes the procedures used by various analysis groups to predict fatigue-crack growth under random loading. This aspect is important in the design, analysis, and test evaluation of a structure.



Table of Contents

Introduction
Hudson C.

Summary
Chang J.

Round-Robin Crack Growth Predictions on Center-Cracked Tension Specimens under Random Spectrum Loading
Chang J.

A Root-Mean-Square Approach for Predicting Fatigue Crack Growth under Random Loading
Hudson C.

A Crack-Closure Model for Predicting Fatigue Crack Growth under Aircraft Spectrum Loading
Newman J.

Multi-Parameter Yield Zone Model for Predicting Spectrum Crack Growth
Johnson W.

Crack Growth Behavior of Center-Cracked Panels under Random Spectrum Loading
Engle R., Rudd J.

Random Spectrum Fatigue Crack Life Predictions With or Without Considering Load Interactions
Chang J., Liu K., Szamossi M.

Index


Committee: E08
Paper ID: STP748-EB
DOI: 10.1520/STP748-EB
ISBN-EB: 978-0-8031-4814-7

ASTM International is a member of CrossRef.
0-8031-0715-3
978-0-8031-0715-1
STP748-EB