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Digital Library / STP / STP699-EB
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Applied Surface Analysis
Barr TL
Pages: 212
Published: 1980
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Description
Table of Contents
Introduction
Barr TL
Summary
Davis LE
Application of Surface Analysis for Electronic Devices
Holloway PH
Electron Spectroscopy in Catalyst Research
Brinen JS
AES and ESCA Analysis of Iron Oxides Formed by a Galvanic Cell
Stout DA, Gavelli G, Lumsden JB, Staehle RW
Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys
Conner GR
Surface Composition of Copper-Nickel Alloys
Ling DT, Lindau I, Miller JN, Spicer WE
New Developments in Secondary Ion Mass Spectrometry
Werner HW
Ion Scattering Spectroscopy
Taglauer E, Heiland W
Data Treatment in Electron and Ion Spectroscopy
Baun WL
Energy Calibration of Electron Spectrometers
Wagner CD
Application of a Vacuum Transfer Device for Exchange of Surface Standards
Hobson JP, Kornelsen EV
Digital Data Acquisition and Processing in an Auger Electron Spectrometer
Strausser YE
Application of XPS Analysis to Research into the Causes of Corrosion
Castle JE
Index
Committee: E42
Paper ID: STP699-EB
DOI: 10.1520/STP699-EB
ASTM International is a member of CrossRef.
0-8031-0277-1
978-0-8031-0277-4
STP699-EB
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