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SEDL / STP / STP699-EB
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STP699
Applied Surface Analysis
Barr TL, Davis LE
Pages: 212
Published: 1980
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Presents a forum devoted solely to the technology and problem inherent in applications of surface analysis. Addresses the surface science itself, while concentrating on the present level and direction of the science in its more applied areas. Main application areas are covered broadly divided into materials analysis and chemical surface analysis through the publication of several papers which deal with the quantitative determinations of surface composition in both areas.
Table of Contents
Introduction
Barr T.
Summary
Davis L.
Application of Surface Analysis for Electronic Devices
Holloway P.
Electron Spectroscopy in Catalyst Research
Brinen J.
In Situ AES and ESCA Analysis of Iron Oxides Formed by a Galvanic Cell
Gavelli G., Lumsden J., Staehle R., Stout D.
Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys
Conner G.
Surface Composition of Copper-Nickel Alloys
Lindau I., Ling D., Miller J., Spicer W.
New Developments in Secondary Ion Mass Spectrometry
Werner H.
Ion Scattering Spectroscopy
Heiland W., Taglauer E.
Data Treatment in Electron and Ion Spectroscopy
Baun W.
Energy Calibration of Electron Spectrometers
Wagner C.
Application of a Vacuum Transfer Device for Exchange of Surface Standards
Hobson J., Kornelsen E.
Digital Data Acquisition and Processing in an Auger Electron Spectrometer
Strausser Y.
Application of XPS Analysis to Research into the Causes of Corrosion
Castle J.
Index
Committee: E42
Paper ID: STP699-EB
DOI: 10.1520/STP699-EB
ISBN-EB: 978-0-8031-5552-7
 ASTM International is a member of CrossRef.
0-8031-0277-1
978-0-8031-0277-4
STP699-EB
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