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Applied Surface Analysis Barr TL Pages: 212       Published: 1980

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Table of Contents

Introduction
Barr TL

Summary
Davis LE

Application of Surface Analysis for Electronic Devices
Holloway PH

Electron Spectroscopy in Catalyst Research
Brinen JS

AES and ESCA Analysis of Iron Oxides Formed by a Galvanic Cell
Stout DA, Gavelli G, Lumsden JB, Staehle RW

Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys
Conner GR

Surface Composition of Copper-Nickel Alloys
Ling DT, Lindau I, Miller JN, Spicer WE

New Developments in Secondary Ion Mass Spectrometry
Werner HW

Ion Scattering Spectroscopy
Taglauer E, Heiland W

Data Treatment in Electron and Ion Spectroscopy
Baun WL

Energy Calibration of Electron Spectrometers
Wagner CD

Application of a Vacuum Transfer Device for Exchange of Surface Standards
Hobson JP, Kornelsen EV

Digital Data Acquisition and Processing in an Auger Electron Spectrometer
Strausser YE

Application of XPS Analysis to Research into the Causes of Corrosion
Castle JE

Index


Committee: E42
Paper ID: STP699-EB
DOI: 10.1520/STP699-EB

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0-8031-0277-1
978-0-8031-0277-4
STP699-EB