STP643

    Quantitive Surface Analysis of Materials

    McIntyre NS

    Pages: 215

    Published: 1978

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    The symposium on Progress in Quantitative Surface Analysis was held on 2—3 March 1977 in conjunction with the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy in Cleveland, Ohio. The symposium was sponsored by the American Society for Testing and Materials through its Committee E42 on Surface Analysis. N. S. McIntyre, Atomic Energy of Canada Limited and vice-chairman (publications) of ASTM Committee E42, served as symposium chairman and editor of this publication. J. R. Cuthill, National Bureau of Standards and chairman of Committee E42, David Hercules, University of Pittsburgh, and G. G. Sweeney, Westinghouse Research Laboratories, served as session chairmen. Papers from the symposium as well as appropriate papers from the regular Pittsburgh Conference sessions on surface analysis are included in this special technical publication.


    Table of Contents

    Introduction
    McIntyre N.

    Summary
    McIntyre N.

    The Physical Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
    Powell C.

    How Quantitative is Electron Spectroscopy for Chemical Analysis?—An Evaluation of the Significant Factors
    Wagner C.

    Some Aspects of Quantitative Surface Analysis by Electron Spectroscopy for Chemical Analysis
    Carter W., Hercules D., Phillips L., Salvati L.

    Quantitative Comparison of the Doubly Integrated KLL Auger Spectra of Magnesium, Aluminum, and Silicon with Their Oxides
    Grant J., Haas T., Springer R.

    In Situ Auger Electron Spectroscopy Tensile Fracture Study of Nickel Alloys
    Anderson N., Gumz K., Walsh J.

    Electron Spectroscopy for Chemical Analysis Examination of Rare Earth and Near Rare Earth Species
    Barr T.

    The Use of Soft X-Ray Photoemission Spectroscopy to Study the Adsorption of Oxygen on the (110) Surface of Gallium Arsenide and Gallium Antimonide
    Lindau I., Pianetta P., Spicer W.

    Quantitative Analysis by Secondary Ion Mass Spectrometry
    Newbury D.

    Quantitative Analysis of Alloys and Thin Films Using Ion Scattering Spectroscopy
    Baun W.

    Surface Analysis of Polymer and Glass
    Mismash H., Sparrow G.

    Secondary Ion Mass Spectrometry and Auger Electron Spectroscopy Semiquantitative Analysis of Metal Alloys
    Davis L., Gerlach R.

    X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry: A Multitechnique Approach to Surface Analysis
    Baitinger W., Delgass W., Hewitt R., Ott G., Shepard A., Slusser G., Winograd N.

    Index


    Committee: E42

    Paper ID: STP643-EB

    DOI: 10.1520/STP643-EB

    ISBN-EB: 978-0-8031-4715-7

    ISBN-PRINT: 978-0-8031-0543-0

    ASTM International is a member of CrossRef.

    0-8031-0543-6
    978-0-8031-0543-0
    STP643-EB