The symposium on Progress in Quantitative Surface Analysis was held on 23 March 1977 in conjunction with the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy in Cleveland, Ohio. The symposium was sponsored by the American Society for Testing and Materials through its Committee E42 on Surface Analysis. N. S. McIntyre, Atomic Energy of Canada Limited and vice-chairman (publications) of ASTM Committee E42, served as symposium chairman and editor of this publication. J. R. Cuthill, National Bureau of Standards and chairman of Committee E42, David Hercules, University of Pittsburgh, and G. G. Sweeney, Westinghouse Research Laboratories, served as session chairmen. Papers from the symposium as well as appropriate papers from the regular Pittsburgh Conference sessions on surface analysis are included in this special technical publication.
Some Aspects of Quantitative Surface Analysis by Electron Spectroscopy for Chemical Analysis
Carter W., Hercules D., Phillips L., Salvati L.
Quantitative Comparison of the Doubly Integrated KLL Auger Spectra of Magnesium, Aluminum, and Silicon with Their Oxides
Grant J., Haas T., Springer R.
In Situ Auger Electron Spectroscopy Tensile Fracture Study of Nickel Alloys
Anderson N., Gumz K., Walsh J.
Surface Analysis of Polymer and Glass
Mismash H., Sparrow G.
X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry: A Multitechnique Approach to Surface Analysis
Baitinger W., Delgass W., Hewitt R., Ott G., Shepard A., Slusser G., Winograd N.
Paper ID: STP643-EB