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Digital Library / STP / STP596-EB
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Surface Analysis Techniques for Metallurgical Applications
Cuthill JR
Pages: 153
Published: 1976
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Description
Table of Contents
Introduction
Cuthill JR, Carbonara RS
Summary
Chemical Analysis of Surfaces
Park RL
Some Quantitative Aspects of the X-Ray Photoelectron Spectroscopy Analysis of Metal and Oxide Surfaces
McIntyre NS, Cook MG
ESCA Studies of Nickel-Boron Electroless Coatings
Swingle RS, Ginnard CR, Madden GI
Composition of Protective Films Formed on Iron and Stainless Steels
Lumsden JB, Staehle RW
Quantitative Auger Electron Spectroscopy with Elemental Sensitivity Factors
Davis LE, Joshi A
Application of Auger Electron Spectroscopy to the Study of Embrittlement in Nickel
Walsh JM, Anderson NP
Determination of the Low Temperature Diffusion of Chromium Through Gold Films by Ion Scattering Spectroscopy and Auger Electron Spectroscopy
Nelson GC, Holloway PH
Comparison of Evaporated Surface Coatings Using the Ion Scattering Spectrometer and the Auger Electron Spectrometer
Bingle WD
Chemistry of Metal and Alloy Adherends by Secondary Ion Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy
Baun WL, McDevitt NT, Solomon JS
Errors Observed in Quantitative Ion Microprobe Analysis
Newbury DE, Heinrich KFJ, Myklebust RL
Small Area Depth Profiling with the Ion Microprobe
Whatley TA, Comaford DJ, Colby J, Miller P
Analysis of Solids Using a Quadrupole Mass Filter
Fralick RD, Roden HJ, Hinthorne JR
Index
Committee: E42
Paper ID: STP596-EB
DOI: 10.1520/STP596-EB
ASTM International is a member of CrossRef.
0-8031-0584-3
978-0-8031-0584-3
STP596-EB
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