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SEDL / STP / STP596-EB
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STP596
Surface Analysis Techniques for Metallurgical Applications
Cuthill JR, Carbonara RS
Pages: 153
Published: 1976
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Deals with ion scattering spectroscopy, auger electron spectroscopy, for chemical analysis, and ion microprobe mass analysis in twelve extensive papers.
Table of Contents
Introduction
Carbonara R., Cuthill J.
Summary
Chemical Analysis of Surfaces
Park R.
Some Quantitative Aspects of the X-Ray Photoelectron Spectroscopy Analysis of Metal and Oxide Surfaces
Cook M., McIntyre N.
ESCA Studies of Nickel-Boron Electroless Coatings
Ginnard C., Madden G., Swingle R.
Composition of Protective Films Formed on Iron and Stainless Steels
Lumsden J., Staehle R.
Quantitative Auger Electron Spectroscopy with Elemental Sensitivity Factors
Davis L., Joshi A.
Application of Auger Electron Spectroscopy to the Study of Embrittlement in Nickel
Anderson N., Walsh J.
Determination of the Low Temperature Diffusion of Chromium Through Gold Films by Ion Scattering Spectroscopy and Auger Electron Spectroscopy
Holloway P., Nelson G.
Comparison of Evaporated Surface Coatings Using the Ion Scattering Spectrometer and the Auger Electron Spectrometer
Bingle W.
Chemistry of Metal and Alloy Adherends by Secondary Ion Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy
Baun W., McDevitt N., Solomon J.
Errors Observed in Quantitative Ion Microprobe Analysis
Heinrich K., Myklebust R., Newbury D.
Small Area Depth Profiling with the Ion Microprobe
Colby J., Comaford D., Miller P., Whatley T.
Analysis of Solids Using a Quadrupole Mass Filter
Fralick R., Hinthorne J., Roden H.
Index
Committee: E42
Paper ID: STP596-EB
DOI: 10.1520/STP596-EB
ISBN-EB: 978-0-8031-5587-9
 ASTM International is a member of CrossRef.
0-8031-0584-3
978-0-8031-0584-3
STP596-EB
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