|
|
|
SEDL / STP / STP557-EB
 |
---->
STP557
Metallography—A Practical Tool for Correlating the Structure and Properties of Materials
Abrams H, Maniar GN
Pages: 241
Published: 1974
|
|
The symposium on Metallography—A Practical Tool for Correlating the Structure and Properties of Materials, was given at the Seventy-sixth Annual Meeting of the American Society for Testing and Materials held in Philadelphia, Pa., 25-26 June 1973. Committee E04 on Metallography sponsored the symposium. Halle Abrams, Bethlehem Steel Corporation, and G. N. Maniar, Carpenter Technology Corporation, presided as symposium cochairmen.
Table of Contents
Introduction
Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography X-Ray Diffraction Analysis, and Electron Microscopy Methods
Weissman S.
X-Ray Diffraction — A Versatile, Quantitative, and Rapid Technique of Metallography
Zwell L.
The Use of Hot-Stage Microscopy in the Study of Phase Transformations
Benscoter A., Bramfitt B., Kilpatrick J., Marder A.
Examination of Materials by Coherent Light Techniques
Blodgett J., Glicksman M., Schaefer R.
The Electron Microprobe as a Metallographic Tool
Goldstein J.
Transmission Electron Microscopy in Materials Research
Capenos J., Wells M.
High Voltage Electron Metallography — Achievements and Prospects
Fisher R., Szirmae A.
Microstructure Approach to Property Optimization in Wrought Superalloys
Maniar G., Muzyka D.
Phase Separation as a Technique for the Characterization of Superalloys
Kriege O.
Committee: E04
Paper ID: STP557-EB
DOI: 10.1520/STP557-EB
ISBN-EB: 978-0-8031-4643-3
 ASTM International is a member of CrossRef.
0-8031-0510-X
978-0-8031-0510-2
STP557-EB
|
