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Digital Library / STP / STP557-EB
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MetallographyA Practical Tool for Correlating the Structure and Properties of Materials
Abrams H
Pages: 241
Published: 1974
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Table of Contents
Introduction
Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography X-Ray Diffraction Analysis, and Electron Microscopy Methods
Weissman S
X-Ray Diffraction A Versatile, Quantitative, and Rapid Technique of Metallography
Zwell L
The Use of Hot-Stage Microscopy in the Study of Phase Transformations
Bramfitt BL, Benscoter AO, Kilpatrick JR, Marder AR
Examination of Materials by Coherent Light Techniques
Schaefer RJ, Blodgett JA, Glicksman ME
The Electron Microprobe as a Metallographic Tool
Goldstein JI
Transmission Electron Microscopy in Materials Research
Wells MGH, Capenos JM
High Voltage Electron Metallography Achievements and Prospects
Szirmae A, Fisher RM
Microstructure Approach to Property Optimization in Wrought Superalloys
Muzyka DR, Maniar GN
Phase Separation as a Technique for the Characterization of Superalloys
Kriege OH
Committee: E04
Paper ID: STP557-EB
DOI: 10.1520/STP557-EB
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0-8031-0510-X
978-0-8031-0510-2
STP557-EB
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