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STP504
Stereology and Quantitative Metallography

Pellissier GE, Purdy SM
Pages: 189
Published: 1972

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The Symposium on Stereology and Quantitative Metallography was presented at the Seventy-fourth Annual Meeting of the American Society for Testing and Materials held in Atlantic City, N. J., 27 June—2 July 1971. Subcommittees 11, 14, and 15 on Electron Microscopy and Diffraction, Quantitative Metallography, and Scanning Microscopy and Microprobe Analysis, respectively, of Committee E04 on Metallography sponsored the symposium. G. E. Pellissier, Ernest F. Fullam, Inc. and S. M. Purdy, Youngstown Sheet and Tube Co., served as cochairmen. Of the ten papers presented at the two sessions, eight are included in this volume.



Table of Contents

Introduction
Pellissier G., Purdy S.

The Mathematical Foundations of Quantitative Stereology
Underwood E.

Application of Topological Concepts in Stereology
Steele J.

Automatic Methods for Analysis of Microstructures
Moore G.

Design of Modern Image Measurement Systems
Morton R.

European Instruments for Quantitative Image Analysis
Exner H.

Correlation Between Yield Strength and Microstructure of Some Carbon Steels
Gurland J.

Quantitative Metallography of the Age Hardening Precipitate in Superalloys by Replica Electron Microscopy
James H., Maniar G., Seher R.

Practical Applications of Quantitative Metallography
Abrams H.

Committee: E04
Paper ID: STP504-EB
DOI: 10.1520/STP504-EB
ISBN-EB: 978-0-8031-4610-5

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0-8031-0095-7
978-0-8031-0095-4
STP504-EB