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SEDL / STP / STP493-EB
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STP493
Applications of Electron Microfractography to Materials Research
Wiebe W
Pages: 102
Published: 1971
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The Symposium on Applications of Electron Microfractography to Materials Research was given at the Seventy-third Annual Meeting of the American Society for Testing and Materials held in Toronto, Ont., Canada, 21—26 June 1970. The Sponsor of this symposium was ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E24 on Fracture Testing of Metals. W. Wiebe, National Research Council of Canada, presided as symposium chairman.
Table of Contents
Introduction
Wiebe W.
Correlation of Fracture Toughness, KIc/, with Fractographically Derived Plastic Stretched Zone Width—a Report of Astm E-24/II Task Group
Brothers A., Hill M., Parker M., Spitzig W., Wiebe W., Wolff U.
Microfractographic Features of Stretched Zone in an Aluminum Alloy Fracture Toughness Specimen
Wolff U.
Correlation of Microfractography and Macrofractography of AISI 4340 Steel—A Report of ASTM E-24/II Task Group
Biehler D., Carr F., Connolly A., Dragen R., Faller J., Johari O., Morais R., Parker M., Sailors R.
Failure Analysis of a Bonded Honeycomb Structure: A Case Study Employing SEM
Bailey C.
Application of Electron Fractography to the Study of High-temperature Cavitation in Tungsten
Farrell K., Stiegler J.
Electron Fractography of High Temperature, High Strain Rate Fracture
Bucher J., Wilber G.
Committee: E08
Paper ID: STP493-EB
DOI: 10.1520/STP493-EB
ISBN-EB: 978-0-8031-4600-6
 ASTM International is a member of CrossRef.
0-8031-0746-3
978-0-8031-0746-5
STP493-EB
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