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Digital Library / STP / STP485-EB
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Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis
Russ JC
Pages: 287
Published: 1971
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Table of Contents
Introduction
Russ J.
X-Ray Energy Spectrometry in the 0.1 to 10 Å Range
Fitzgerald R., Gantzel P.
The Future of Silicon X-Ray Detectors
Aitken D., Woo E.
Low-Noise Cryogenic Preamplifiers
Elad E.
Characterization Of Semiconductor X-ray Energy Spectrometers
Walter F.
Energy Dispersion X-Ray Analysis with Electron and Isotope Excitation
Sandborg A.
Role of Multichannel Analyzer in Data Handling
Williams G.
Solid-State X-ray Detectors for Electron Microprobe Analysis
Lifshin E.
Energy Dispersion X-ray Analysis on the Scanning Electron Microscope
Russ J.
Energy Dispersion X-ray Analysis with the Transmission Electron Microscope
Bender S., Duff R.
Role of the Gas Flow Proportional Counter in Energy Dispersive Analysis
Sutfin L., Ogilvie R.
Light Element Analysis Using the Semiconductor X-ray Energy Spectrometer with Electron Excitation
Russ J.
Rapid Quantitative Electron Probe Microanalysis with a Nondiffractive Detector System
Myklebust R., Heinrich K.
Design and Application of X-ray Emission Analyzers Using Radioisotope X-ray or Gamma Ray Sources
Rhodes J.
Committee: E04
Paper ID: STP485-EB
DOI: 10.1520/STP485-EB
ASTM International is a member of CrossRef.
0-8031-0070-1
978-0-8031-0070-1
STP485-EB
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