SEDL / STP / STP485-EB
STP485 Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis Russ JC Pages: 287 Published: 1971
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Covered in 13 papers are such topics as x-ray spectrometry, detectors, electron probes, and emission sources. An extremely comprehensive volume.
Table of Contents Introduction Russ J. X-Ray Energy Spectrometry in the 0.1 to 10 Å Range Fitzgerald R., Gantzel P. The Future of Silicon X-Ray Detectors Aitken D., Woo E. Low-Noise Cryogenic Preamplifiers Elad E. Characterization Of Semiconductor X-ray Energy Spectrometers Walter F. Energy Dispersion X-Ray Analysis with Electron and Isotope Excitation Sandborg A. Role of Multichannel Analyzer in Data Handling Williams G. Solid-State X-ray Detectors for Electron Microprobe Analysis Lifshin E. Energy Dispersion X-ray Analysis on the Scanning Electron Microscope Russ J. Energy Dispersion X-ray Analysis with the Transmission Electron Microscope Bender S., Duff R. Role of the Gas Flow Proportional Counter in Energy Dispersive Analysis Ogilvie R., Sutfin L. Light Element Analysis Using the Semiconductor X-ray Energy Spectrometer with Electron Excitation Russ J. Rapid Quantitative Electron Probe Microanalysis with a Nondiffractive Detector System Heinrich K., Myklebust R. Design and Application of X-ray Emission Analyzers Using Radioisotope X-ray or Gamma Ray Sources Rhodes J. Committee: E04 Paper ID: STP485-EB DOI: 10.1520/STP485-EB ISBN-EB: 978-0-8031-5571-8 ASTM International is a member of CrossRef. 0-8031-0070-1 978-0-8031-0070-1 STP485-EB
