Digital Library / STP / STP372-EB

STP372 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis Mihalisin J. Pages: 97 Published: 1964

Table of Contents

Introduction


Specimen Damage during Cutting and Grinding
Szirmae A., Fisher R.

Electron Microscopy of Stress-Corrosion Cracking in AM 350 Steel for a Supersonic Transport
Tiner N.

Application of a Conducting Mask for Thinning Metallic Foils for Electron Transmission Microscopy
Despres T.

Investigation of Microstructure and Room-Temperature Fracture in SM-200 Nickel-Base Alloy
Hertzberg R., Ford J.

Microconstituents in High-Speed Steel
Koh P., Nikkel H.

Variable Bias Illumination Control for the Electron Microscope
McPartland J., Daniel J.

Two New Indexes to the Powder Diffraction File
Bigelow W., Smith J.

Committee: E04
Paper ID: STP372-EB
DOI: 10.1520/STP372-EB
ISBN-EB: 978-0-8031-6802-2

ASTM International is a member of CrossRef.
0-8031-6612-5
978-0-8031-6612-7
STP372-EB