SEDL / STP / STP372-EB
STP372 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis Mihalisin J. Pages: 97 Published: 1964
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Table of Contents Introduction Specimen Damage during Cutting and Grinding Fisher R., Szirmae A. Electron Microscopy of Stress-Corrosion Cracking in AM 350 Steel for a Supersonic Transport Tiner N. Application of a Conducting Mask for Thinning Metallic Foils for Electron Transmission Microscopy Despres T. Investigation of Microstructure and Room-Temperature Fracture in SM-200 Nickel-Base Alloy Ford J., Hertzberg R. Microconstituents in High-Speed Steel Koh P., Nikkel H. Variable Bias Illumination Control for the Electron Microscope Daniel J., McPartland J. Two New Indexes to the Powder Diffraction File Bigelow W., Smith J. Committee: E04 Paper ID: STP372-EB DOI: 10.1520/STP372-EB ISBN-EB: 978-0-8031-6802-2 ASTM International is a member of CrossRef. 0-8031-6612-5 978-0-8031-6612-7 STP372-EB
