SEDL / STP / STP349-EB
STP349 Symposium on X-Ray and Electron Probe Analysis Committee E-2 , Committee E-4 Pages: 218 Published: 1964
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Table of Contents Summary of Papers on the Electron Probe Wyman L. Production of X-rays in X-ray Emission Spectrography Zemany P. X-ray Optics in Electron Microanalysis Ogilvie R. X-ray Detectors Dunne J., Kiley W. X-ray Spectrographic Analysis of Metals and Minerals: Scope and Limitations of Quantitative Analysis Kemp J. Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films Campbell W. X-ray Spectrographic Analysis of Liquids and Solutions Gunn E. Summary of Papers on X-ray Spectrochemical Analysis Michaelis R. Electron Optical Design of Electron Probes Fisher R. Methods of Quantitative Electron Probe Analysis Wittry D. Comparison of X-ray Fluorescence and Electron Probe Methods: Future Trends Birks L. Electron Probe Analysis in Metallurgical Research Heinrich K. Electron Probe Analysis of Minerals Adler I. Electron Probe X-ray Microanalysis of Medical and Biological Specimens Tousimis A. Committee: E13 Paper ID: STP349-EB DOI: 10.1520/STP349-EB ISBN-EB: 978-0-8031-6749-0 ASTM International is a member of CrossRef. 0-8031-6603-6 978-0-8031-6603-5 STP349-EB
