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    STP342

    Symposium on Cleaning and Materials Processing for Electronics and Space Apparatus

    Committee F-1
    Published: 1963


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    Table of Contents

    Introduction

    Portable Low-Cost Polyethylene Ultraclean Assembly Areas

    A New Principle for Airborne Contamination Control in Clean Rooms and Work Stations

    A Comparison of Dust Count Data Obtained from Different Measuring Methods

    A Review of the Gravity-Settling Technique for Measuring Airborne Dust in Electron Device Processing Areas

    Enumeration of Airborne Particulate Matter by the Scattered Light Technique

    A Referee Method for Sizing and Counting of Airborne Particulate Contamination

    Tentative Method for Sizing and Counting Airborne Particulate Contamination in Clean Rooms and Other Dust-Controlled Areas Designed for Electronic and Similar Applications

    The Silting Index: An Evaluation of Micron and Submicron Contamination in Liquids

    Chemical Factors in the use and Handling of Electronic Grade Hydrogen Peroxide

    Effect of Temperature on Resistance of Ultrapure Organic Solvents

    Chemical Durability Evaluation of Electronic Glasses

    Methods of Evaluating Sonic Cleaning Systems

    Effect of Temperature on Ultrasonic Cavitation of Fluorinated Solvents

    The Role of Cavitation in Sonic Energy Cleaning

    An Instrument for the Contactless Measurement of Minority Carrier Lifetime

    Photography and Metal Parts Production

    An Ionized Gas Jet Surface Cleaner

    Characteristics of Frequency Control Devices for Satellite Environments

    Doping of Germanium Transistor Surfaces by Fluid-Base Encapsulant Systems

    Both Reversible and Permanent Effects of Moisture After Stress on Electrical Characteristics of Germanium Transistors

    Some Experiments on Water Introduced Into Electron Tubes

    Evaluation of Polycrystalline Silicon Batches for Czochralski Crystal Pulling

    Infrared-Tested Surface Properties of Semiconductor Wafers

    Evaluation of Semiconductor Epitaxial Layers Report of Subcommittee 6 of ASTM Committee F-1

    Modular Dopant for Silicon Czochralski Crystals

    The Preparation and Properties of Single Crystals of Aluminum Antimonide


    Committee: F01

    DOI: 10.1520/STP342-EB

    ISBN-EB: 978-0-8031-6211-2

    ISBN-13: 978-0-8031-6139-9

    ASTM International is a member of CrossRef.

    0-8031-6139-5
    978-0-8031-6139-9
    STP342-EB