SEDL / STP / STP339-EB
STP339 Symposium on Advances in Techniques in Electron Metallography Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Electron Metallography Pages: 76 Published: 1963
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Table of Contents Introduction Mihalisin J. Electron Probe Microanalysis: A New Method of Calculating Absorption Correction Philibert J. Problems of Precision and Accuracy in Measurement of Electron Diffraction Patterns Beu K. Accuracy of Interplanar Spacing Determinations by 50-kv Electron Diffraction Dorsey J. Practical Considerations in the Interpretation of Electron Diffraction Patterns Sturkey L. Comparison of Replicas and Thin Sections of NI-O-NEL Pellier L. Modified Thinning Technique for Transmission Electron Microscopy Kiefer D., Melton C., Schwartz C. An Improved Procedure for Thinning Metallic Specimens for Transmission Electron Microscopy Glenn R., Raley J. Identification of Phases in Age-Hardenable Nickel-Copper-Aluminum-Titanium Alloy Fragetta W., Mihalisin T. Committee: E04 Paper ID: STP339-EB DOI: 10.1520/STP339-EB ISBN-EB: 978-0-8031-5983-9 ASTM International is a member of CrossRef. 0-8031-6137-9 978-0-8031-6137-5 STP339-EB
