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Symposium on Advances in Techniques in Electron Metallography Pages: 76       Published: 1963

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Table of Contents

Introduction
Mihalisin J.

Electron Probe Microanalysis: A New Method of Calculating Absorption Correction
Philibert Jean

Problems of Precision and Accuracy in Measurement of Electron Diffraction Patterns
Beu Karl

Accuracy of Interplanar Spacing Determinations by 50-kv Electron Diffraction
Dorsey John

Practical Considerations in the Interpretation of Electron Diffraction Patterns
Sturkey L.

Comparison of Replicas and Thin Sections of NI-O-NEL
Pellier Laurence

Modified Thinning Technique for Transmission Electron Microscopy
Melton C., Schwartz C., Kiefer D.

An Improved Procedure for Thinning Metallic Specimens for Transmission Electron Microscopy
Glenn R., Raley J.

Identification of Phases in Age-Hardenable Nickel-Copper-Aluminum-Titanium Alloy
Fragetta W., Mihalisin T.

Committee: E04
Paper ID: STP339-EB
DOI: 10.1520/STP339-EB

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0-8031-6137-9
978-0-8031-6137-5
STP339-EB