SEDL / STP / STP308-EB
STP308 Symposium on Extension of Sensitivity for Determining Various Constituents in Metals Committee E-2 , Committee E-3 Pages: 74 Published: 1962
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Table of Contents Introduction Gordon N. Some Recently Developed Electroanalytical Techniques for Determination of Traces of Metals Meites L. Radioactivation Analysis—Specific for Trace Element Determinations Leddicotte G. Ultratrace Emission Spectroscopy Morrison G., Rupp R. Use of the Electron Probe to Measure Low Average but High Local Concentrations Birks L., Seebold R. Extension of Sensitivity in Analysis of Impurities in Solids by Mass Spectrometry Stevens C. Committee: E02E03 Paper ID: STP308-EB DOI: 10.1520/STP308-EB ISBN-EB: 978-0-8031-6202-0 ASTM International is a member of CrossRef. 0-8031-6203-0 978-0-8031-6203-7 STP308-EB
