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SEDL / STP / STP157-EB
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STP157
Symposium on Fluorescent X-ray Spectrographic Analysis
Committee E-2
Pages: 72
Published: 1954
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Table of Contents
Introduction
Ashcraft E.
Basic Theory and Fundamentals of Fluorescent X-ray Spectrographic Analysis
Birks L., Brooks E., Friedman H.
The Correlation Between Fluorescent X-ray Intensity and Chemical Composition
Sherman J.
Use of Multichannel Recording in X-ray Fluorescent Analysis
Hasler M., Kemp J.
Examination of Metallic Materials by X-ray Emission Spectrography
Brissey R., Liebhafsky H., Pfeiffer H.
An Absolute Method of X-ray Fluorescence Analysis Applied to Stainless Steels
Noakes G.
The Fluorescent X-ray Spectrographic Analysis of Minerals
Campbell W., Carl H.
Committee: E04
Paper ID: STP157-EB
DOI: 10.1520/STP157-EB
ISBN-EB: 978-0-8031-5930-3
 ASTM International is a member of CrossRef.
0-8031-6084-4
978-0-8031-6084-2
STP157-EB
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