Published: Jan 1965
| ||Format||Pages||Price|| |
|PDF (664K)||21||$25||  ADD TO CART|
|Complete Source PDF (3.6M)||21||$55||  ADD TO CART|
The application of X-ray spectrochemical analysis to various materials has undergone marked expansion in recent years. Special examples from the authors' experiences in the analysis of cements and dental materials are cited. Difficulties in presenting a representative sample to the primary X-ray beam are described, together with means for minimizing these difficulties. Interelement corrections for the X-ray analysis of cement are discussed. References are given to the work of numerous investigators in this field.
Bean, B. L.
Chemist, National Bureau of Standards, Washington, D. C.,
Mulligan, B. W.
chemist, National Bureau of StandardsHarry Diamond Laboratories, Washington, D. C.Washington, D. C.,
Paper ID: STP47127S