SEDL / STP / STP363-EB / STP47063S



Effects of Space Radiation on Transistors

Gardner, Leonard B.
President, Consulting Scientists, North Hollywood, Calif.

Coss, James R.
Senior Engineer, Northrop Space Laboratories, Hawthorne, Calif.


Pages: 7    Published: Jan 1964


Download this paper for $25 PDF (160K)          View License Agreement
Abstract

The present state of the art allows transistors to operate up to 1 year for a space probe. This is for thin-base germanium devices. Other devices, such as thick-base and silicon, are restricted to shorter periods. For devices orbiting in the center of the inner Van Allen belt, the useful life of thin-base transistors is approximately 3 days. These lifetimes may be increased by suitable shielding. Latest transistor development, such as very-high-frequency germanium devices, should increase the lifetimes by an order of magnitude.


Paper ID: STP47063S
Committee/Subcommittee: E10.07
DOI: 10.1520/STP47063S
CrossRef ASTM International is a member of CrossRef.