SEDL / STP / STP161-EB / STP46779S

Measurement of Dielectric Properties at Temperatures up to 500 C

Scott, A. H.
Physicist, National Bureau of Standards, Washington, D. C.

Ehrlich, Paul
Harvard UniversityNational Bureau of Standards, Cambridge, Mass.

Richardson, J. F.
Physicist, National Bureau of Standards, Washington, D. C.

Pages: 12    Published: Jan 1954

Download this paper for $25 PDF (512K)          View License Agreement
Abstract

A holder for dielectric specimens is described which can be used over a temperature range from room temperature to 500 C and over a frequency range from 10² to 10⁷ cps. Provision is made for measuring the thermal expansion of the sample. The dielectric constant can be determined with a probable error not exceeding about 1 per cent and the dissipation factor with a probable error not exceeding about 0.0001 or 5 per cent, whichever is greater, for the lower frequencies and about 0.0015 or 5 per cent, whichever is greater, at 10 mc per sec. Illustrative data on boron nitride and alumina body are given.