STP349

    Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

    Published: Jan 1964


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    Abstract

    Limits of detectability for trace elements in metal, powder, and solution samples range from 0.1 to 100 ppm depending on the element being determined, sample composition, and the complexity of the X-ray spectra. The limits of detectability range from 0.01 to 10 μg for elements that have been preconcentrated chemically in a form suitable for X-ray spectrographic determination.


    Author Information:

    Campbell, William J.
    Supervisory Research Chemist, U.S. Department of the Interior, College Park, Md.


    Paper ID: STP45947S

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP45947S


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