STP349: Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

    Campbell, William J.
    Supervisory Research Chemist, U.S. Department of the Interior, College Park, Md.

    Pages: 22    Published: Jan 1964


    Abstract

    Limits of detectability for trace elements in metal, powder, and solution samples range from 0.1 to 100 ppm depending on the element being determined, sample composition, and the complexity of the X-ray spectra. The limits of detectability range from 0.01 to 10 μg for elements that have been preconcentrated chemically in a form suitable for X-ray spectrographic determination.


    Paper ID: STP45947S

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP45947S


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