STP349

    X-ray Optics in Electron Microanalysis

    Published: Jan 1964


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    Abstract

    The electron microanalyzer produces the ideal source for X-ray focusing spectrometry. The cross divergence present in X-ray fluorescence units is absent, and the divergence in the plane of the spectrometer can be used to great advantage. Features of Johansson and Johann optics are discussed in detail as well as spectrometer designs capable of fulfilling these two conditions. The monochromators have been treated from both ideally imperfect and ideally perfect crystal theory. Various types of crystals have also been considered as to their perfection, dispersion, and intensity.


    Author Information:

    Ogilvie, Robert E.
    Massachusetts Institute of Technology, Cambridge, Mass.


    Paper ID: STP45944S

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP45944S


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